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Magazine Name : Ieee Design And Test Of Computers

Year : 2000 Volume number : 17 Issue: 03

A Reliability Testing Environment For Off-The - Shelf Memory Subsystems. (Article)
Subject:
Author: Gwan S Choi      Seung H Hwang     
page:      116 - 125
Overview Of Popular Benchmark Sets. (Article)
Subject:
Author: T Saramaki     
page:      15 - 17
The Mutating Metric For Benchmarking Test. (Article)
Subject:
Author: T. W Williams      Rohit Kapur     
page:      18 - 21
System Specification Experiments On Common Benchmark. (Article)
Subject:
Author: Wolfgang Nebel      Eduard Moser      Giulio Gorla     
page:      22 - 33
Inserting Scan At The Behavioral Level. (Article)
Subject:
Author: Chouki Aktouf      Herve Fleury      Chantal Robach     
page:      34 - 43
Rt-Level Itc'99 Benchmarks And First Atpg Results. (Article)
Subject:
Author: Giovanni Squillero      Matteo Sonza Reorda      Fulvio Corno     
page:      44 - 53
First Results Of Itc'99 Benchmark Circuits. (Article)
Subject:
Author: Luis Basto     
page:      54 - 59
Using A Soft Core In A Soc Design: Experiences With Picojava. (Article)
Subject:
Author: Li Chen      Debashis Panigrahi      Li Chen     
page:      60 - 71
An Automatic Controller Extractor For Hdl Descriptins At The Rtl. (Article)
Subject:
Author: Jing-Yang Jou      Chien Nan-Jimmy Liu     
page:      72 - 77
A Methamodel For Studying Concepts In Electronic System Design. (Article)
Subject:
Author: Ahmed Hemani      Shashi Kumar      Axel Jantsch     
page:      78 - 85
Design Methodology For A Large Communication Chip. (Article)
Subject:
Author: Rolf Clauberg      Peter Buchmann      David J Webb     
page:      86 - 94
Semicustom Desin Of An Ieee 1394-Compliant Reusable Ic Core. (Article)
Subject:
Author: Mauro Olivieri      Mauro Bertacchi      Alessandro De Gloria     
page:      95 - 105