Your search returned 12 records. Click on the hyperlinks to view further details of Titles..
Magazine Name : Ieee Design And Test Of Computers
Year : 2000Volume number : 17Issue:03
A Reliability Testing Environment For Off-The - Shelf Memory Subsystems.(Article) Subject:
Author:
Gwan S
Choi
Seung H
Hwang
page:
116
-
125
Overview Of Popular Benchmark Sets.(Article) Subject:
Author:
T
Saramaki
page:
15
-
17
The Mutating Metric For Benchmarking Test.(Article) Subject:
Author:
T. W
Williams
Rohit
Kapur
page:
18
-
21
System Specification Experiments On Common Benchmark.(Article) Subject:
Author:
Wolfgang
Nebel
Eduard
Moser
Giulio
Gorla
page:
22
-
33
Inserting Scan At The Behavioral Level.(Article) Subject:
Author:
Chouki
Aktouf
Herve
Fleury
Chantal
Robach
page:
34
-
43
Rt-Level Itc'99 Benchmarks And First Atpg Results.(Article) Subject:
Author:
Giovanni
Squillero
Matteo
Sonza Reorda
Fulvio
Corno
page:
44
-
53
First Results Of Itc'99 Benchmark Circuits.(Article) Subject:
Author:
Luis
Basto
page:
54
-
59
Using A Soft Core In A Soc Design: Experiences With Picojava.(Article) Subject:
Author:
Li
Chen
Debashis
Panigrahi
Li
Chen
page:
60
-
71
An Automatic Controller Extractor For Hdl Descriptins At The Rtl.(Article) Subject:
Author:
Jing-Yang
Jou
Chien
Nan-Jimmy Liu
page:
72
-
77
A Methamodel For Studying Concepts In Electronic System Design.(Article) Subject:
Author:
Ahmed
Hemani
Shashi
Kumar
Axel
Jantsch
page:
78
-
85
Design Methodology For A Large Communication Chip.(Article) Subject:
Author:
Rolf
Clauberg
Peter
Buchmann
David J
Webb
page:
86
-
94
Semicustom Desin Of An Ieee 1394-Compliant Reusable Ic Core.(Article) Subject:
Author:
Mauro
Olivieri
Mauro
Bertacchi
Alessandro De
Gloria
page:
95
-
105